Patrick Joseph Howard
17Patents
7h-index
44Co-inventors
66Inventor score
Filing activity: Mar 19, 1993 → Apr 10, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5371462A | Eddy current inspection method employing a probe array with test and reference data acquisition and signal processing | Physics | 67 | Expired |
| US5608814A | Method of dynamic thresholding for flaw detection in ultrasonic C-scan images | Physics | 24 | Expired |
| US8442301B2 | Nondestructive inspection method and system | Physics | 19 | Active |
| US5549002A | Method for detecting and characterizing flaws in engineering materials | Physics | 18 | Expired |
| US7263888B2 | Two dimensional phased arrays for volumetric ultrasonic inspection and methods of use | Physics | 13 | Expired |
| US5471878A | Method of suppressing grain noise in ultrasonic waveform data by 3D filtering | Physics | 7 | Expired |
| US7328620B2 | Methods and system for ultrasound inspection | Physics | 7 | Expired |
| US8238642B2 | Methods and apparatus for measuring 3D dimensions on 2D images | Physics | 6 | Active |
| US7082403B2 | System and method for managing customer productivity through central repository | Physics | 5 | Expired |
| US7606445B2 | Methods and systems for ultrasound inspection | Physics | 5 | Active |
| US10203290B2 | Method for defect indication detection | Physics | 4 | Active |
| US10481108B2 | System for defect indication detection | Physics | 4 | Active |
| US7995829B2 | Method and apparatus for inspecting components | Physics | 3 | Active |
| US7503218B2 | Methods and system for ultrasound inspection | Physics | 3 | Active |
| US6457898B1 | Ultrasonic transducer connector assembly | Emerging Cross-Sectional Technologies | 3 | Expired |
| US11408836B2 | Method for inspecting components using computed tomography | Physics | 0 | Active |
| US11301977B2 | Systems and methods for automatic defect recognition | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.