Patent · US Expired

Method for the recognition of testing errors in the test of microwirings

US5373233A · kind A · utility

3Cited by

15References

9Claims

0Family size

Assignee

Siemens Aktiengesellschaft · DE

Inventors

Matthias Brunner · Tauberbischofsheim, DE
Ralf Schmid · Karlsruhe, DE

Key dates

Filing date	Aug 13, 1993
Grant date	Dec 13, 1994
Priority date	—
Expiry date	Aug 13, 2013

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/306
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Method for the recognition of testing errors in a test of microwirings. The method for the recognition of testing errors in the test is used in particular in an electron beam test of microwirings in the form of a printed circuit board (LP) having a plurality of networks (NW1 . . . NW9). Every network has a plurality of contact points (1 . . . 24). Interruptions (U) in networks (NW2) and shorts (K1, K2) between networks (NW1 . . . NW3) of a test group (TG1) or, respectively, shorts (K3) between networks (NW2, NW4) of different test groups (TG1, TG2), that are found in a respective main test, are confirmed in a respective follow-up test or testing errors that arose in the main test, for example due to microfields or surface contaminations, are identified.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.