X-ray diffractometer
US5373544A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jun 24, 1993 |
| Grant date | Dec 13, 1994 |
| Priority date | — |
| Expiry date | Jun 24, 2013 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG21K2201/064
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An x-ray diffractometer is equipped with a position sensitive detector and a collimator preceding the detector. The lamellae of the collimator are radially aligned to the specimen, which is arranged in the center of a measurement circle along which the detector and collimator move during a measurement. Therefore, only the x-radiation scattered at the specimen contributes to the measured signal. An elliptically deformed multi-layer mirror is provided at the primary beam side, which deflects the source radiation in the direction of the specimen without great intensity loss and focuses it at a point lying on the measurement circle. Analysis of powdered specimens that are enclosed in glass capillaries can be undertaken. A low-background measurement of diffraction diagrams in an x-ray diffractometer given efficient use of the primary beam is achieved.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.