Method and apparatus for near-field, scanning, optical microscopy by reflective, optical feedback
US5389779A · kind A · utility
68Cited by
2References
22Claims
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Key dates
| Filing date | Jul 29, 1993 |
| Grant date | Feb 14, 1995 |
| Priority date | — |
| Expiry date | Jul 29, 2013 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B11/10541
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Apparatus and methods of near-field scanning optical microscopy (NSOM) are described. A sensing technique is used, in which a light source having an optical cavity is reflectively coupled to the sample surface. Changes in the surface properties of the sample at the sensed location alter the optical feedback in the light source. This leads to detectable changes in the output characteristics of the light source.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.