Locating a field of view in which selected IC conductors are unobscured
US5392222A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Dec 30, 1991 |
| Grant date | Feb 21, 1995 |
| Priority date | — |
| Expiry date | Dec 30, 2011 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/39
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Methods and apparatus are disclosed for positioning the field of view in a system for IC probing or repair, where the system comprises means for supporting an IC device having multiple physical layers and multiple internal nets, and controllable positioning means for positioning the field of view relative to the device. A data set is prepared which describes each physical layer of the device as a plurality of reduced polygons. Each of the reduced polygons is associated with a physical layer of the device and with at least one net of the device. For each of a plurality of selected nets, polygons associated with the net are dilated to define the periphery of a region encompassed by the field of view when a point within the field of view is traced around the periphery of a reduced polygon. A bit plane of the dilated polygons is mapped for each net, and regions of overlap the mapped bit planes are identified. The positioning means is controlled to position the field of view relative to the device at a location which corresponds to at least one overlap region.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.