SCHLUMBERGER TECHNOLOGIES CORPORATION
129Patents
2Active
129Granted
45Portfolio score
Filing activity: Jul 22, 1986 → Nov 9, 2014
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6252412A | Method of detecting defects in patterned substrates | Electricity | 227 | Expired |
| US6232787A | Microstructure defect detection | Electricity | 180 | Expired |
| US6091249A | Method and apparatus for detecting defects in wafers | Physics | 178 | Expired |
| US6344750B1 | Voltage contrast method for semiconductor inspection using low voltage particle beam | Emerging Cross-Sectional Technologies | 156 | Expired |
| US6078898A | System and method of transactional taxation using secure stored data devices | Physics | 142 | Expired |
| US6308317A | Using a high level programming language with a microcontroller | Electricity | 142 | Expired |
| US4945500A | Triangle processor for 3-D graphics display system | Mechanical Engineering; Lighting; Heating | 127 | Expired |
| US5530372A | Method of probing a net of an IC at an optimal probe-point | Electricity | 123 | Expired |
| US4901064A | Normal vector shading for 3-D graphics display system | Physics | 122 | Expired |
| US6308270A | Validating and certifying execution of a software program with a smart card | Physics | 116 | Expired |
| US5675499A | Optimal probe point placement | Electricity | 113 | Expired |
| US5654657A | Accurate alignment of clocks in mixed-signal tester | Electricity | 92 | Expired |
| US5475624A | Test generation by environment emulation | Physics | 89 | Expired |
| US5297057A | Method and apparatus for design and optimization for simulation of motion of mechanical linkages | Emerging Cross-Sectional Technologies | 85 | Expired |
| US6078845A | Apparatus for carrying semiconductor devices | Emerging Cross-Sectional Technologies | 76 | Expired |
| US5109430A | Mask alignment and measurement of critical dimensions in integrated circuits | Physics | 76 | Expired |
| US5892949A | ATE test programming architecture | Physics | 64 | Expired |
| US4931723A | "Automatic test system having a ""true tester-per-pin"" architecture" | Physics | 63 | Expired |
| US5821549A | Through-the-substrate investigation of flip-chip IC's | Electricity | 55 | Expired |
| US4864629A | Image correlation system | Physics | 55 | Expired |
| US5043929A | Closed-form kinematics | Physics | 55 | Expired |
| US5616921A | Self-masking FIB milling | Electricity | 54 | Expired |
| US5402475A | Monitoring and control of parking management system by remote | Electricity | 53 | Expired |
| US5140164A | IC modification with focused ion beam system | Physics | 52 | Expired |
| US5392222A | Locating a field of view in which selected IC conductors are unobscured | Physics | 48 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.