Patent · US Expired

Process for manufacturing semiconductor components

US5393711A · kind A · utility

32Cited by
13References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 12, 1994
Grant dateFeb 28, 1995
Priority date
Expiry dateApr 12, 2014

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S148/135
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A process for manufacturing semiconductor components, especially diodes. The process entails first bonding two semiconductor wafers of different conducting types (p and n), according to a silicon-fusion bonding process (SFB), thereby forming a bonded wafer assembly with a p-n junction. The bonded wafers are then partitioned into a plurality of semiconductor elements by the cutting of grooves into the bonded wafers to a depth which extends at least to the p-n junction. Each of the plurality of semiconductor elements thus formed has an individual p-n junction with sides exposed by the grooves. The sides of the semiconductor elements are then subjected to etching and passivation. The upper and lower surfaces of the bonded wafer assembly are then metal-coated. Finally, the semiconductor elements are separated from each other by a sawing operation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.