Automatic defect inspection apparatus for color filter
US5400135A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Apr 18, 1994 |
| Grant date | Mar 21, 1995 |
| Priority date | — |
| Expiry date | Apr 18, 2014 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/88
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An automatic defect inspection apparatus for a color filter includes a light source for radiating light onto a color filter having a spatially periodical repetitive structure of red, green, and blue, a detector for detecting light from the color filter, and a processor for executing arithmetic processing of the output signal from the detector. In the apparatus, the detector is arranged to detect the light radiated form the light source and transmitted through the color filter, and a diaphragm for limiting the area of the transmitted light incident on the detector in association with an integer multiple of the spatially periodical repetitive structure of red, green, and blue is arranged.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.