Patent · US Expired

Process for high density interconnection of substrates and integrated circuit chips containing sensitive structures

US5401687A · kind A · utility

27Cited by
13References
30Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 15, 1993
Grant dateMar 28, 1995
Priority date
Expiry dateApr 15, 2013

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/15787
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

In a method for preserving an air bridge structure on an integrated circuit chip used in an overlay process, a patternable protective layer is applied for providing mechanical strength to prevent deformation during subsequent processing. A polymeric film layer is applied over the chip and protective layer, and interconnections are fabricated through the polymeric film layer. The polymeric film layer is removed from the area over the air bridge structure. The patternable protective layer is then removed, leaving the resultant structure with an undamaged air bridge which is free of residue.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.