System for enhancing detection of sample components in plasma based sample analysis systems, and method of use
US5404219A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jan 4, 1994 |
| Grant date | Apr 4, 1995 |
| Priority date | — |
| Expiry date | Jan 4, 2014 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/73
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method for extending the limits of detection of plasma based sample analysis systems is disclosed. The preferred embodiment of the present invention system provides a reaction tube which is connected to both a furnace tube and a discharge tube. During use a nebulized sample is caused to pass through the furnace tube wherein its temperature is caused to become elevated. As well, a volatile atom containing, primarily molecular, gas is caused to flow through the discharge tube, while an energy providing electrical discharge occurs therein, such that dissociated volatile atoms are produced. The method of the present invention provides that typically elevated temperature nebulized sample, and the dissociated volatile atoms, be simultaneously entered into a reaction means wherein relatively easily dissociated molecules containing nebulized sample components are formed. The formed relatively easily dissociated molecules, being easier to dissociate than molecules present in the original nebulized sample, it should be appreciated effectively allow detection of nebulized sample components in a plasma based system utilizing the present invention, at lower concentration limits, co…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.