Patent assignee · US · COMPANY

CETAC Technologies Inc.

16Patents
1Active
16Granted
32Portfolio score

Filing activity: Nov 17, 1989 → Mar 7, 2012 · 1 expiring within 5 years

Most-cited patents

PatentTitleAreaCited byStatus
US5192865A Atmospheric pressure afterglow ionization system and method of use, for mass spectrometer sample analysis systems Electricity 101 Expired
US5454274A Sequential combination low temperature condenser and enclosed filter solvent removal system, and method of use Physics 50 Expired
US5033541A Double pass tandem cooling aerosol condenser Physics 46 Expired
US5259254A Sample introduction system for inductively coupled plasma and other gas-phase, or particle, detectors utilizing ultrasonic nebulization, and method of use Electricity 42 Expired
US5400665A Sample introduction system for inductively coupled plasma and other gas-phase, or particle, detectors utilizing an enclosed filter solvent removal system, and method of use Physics 39 Expired
USD675748S1 Testing rack General 32 Active
US5597467A System for interfacing capillary zone electrophoresis and inductively coupled plasma-mass spectrometer sample analysis systems, and method of use Electricity 26 Expired
US5233156A High solids content sample torches and method of use Electricity 16 Expired
US5393673A Method for particulate reagent sample treatment Emerging Cross-Sectional Technologies 15 Expired
US5432096A Simultaneous multiple, single wavelength electromagnetic wave energy absorbtion detection and quantifying spectrophotometric system, and method of use Emerging Cross-Sectional Technologies 11 Expired
US5454860A System for generating and providing a gaseous phase sample at relatively sequentially constant pressure and flow rate Physics 8 Expired
US5272308A Direct injection micro nebulizer and enclosed filter solvent removal sample introduction system, and method of use Physics 8 Expired
US5212365A Direct injection micro nebulizer system and method of use Physics 7 Expired
US5404219A System for enhancing detection of sample components in plasma based sample analysis systems, and method of use Physics 5 Expired
US5382804A Compact photoinization systems Electricity 3 Expired
US5353113A Single and multiple radiation transparent afterglow electric discharge detector systems Physics 1 Expired

Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.