Patent · US Expired

Dynamic random access memory using imperfect isolating transistors

US5414662A · kind A · utility

47Cited by
7References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 4, 1993
Grant dateMay 9, 1995
Priority date
Expiry dateNov 4, 2013

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C11/4094
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Apparatus and methods for controlling the sensing of bit lines which facilitates the distribution of bit line charging current to be distributed any time, and facilitates the fast raising of the sense modes to full logic levels. An embodiment is comprised of a plurality of bit storage capacitors, a folded bit line for receiving charge stored on one of the capacitors, having bit line capacitance, a sense amplifier having a pair of sense nodes for sensing a voltage differential across the sense nodes, apparatus connected to the bit line and the sense nodes for imperfectly isolating the sense nodes from the bit line whereby current can leak therethrough, apparatus for enabling the sense amplifier and for disabling the isolating apparatus and thereby removing the isolation between the sense amplifier and the bit line, whereby current passing through the sense amplifier to the sense nodes is enabled to charge the bit line capacitance through the isolating apparatus to predetermined logic voltage level.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.