Patent · US Expired

Integrated circuit chip placement in a high density interconnect structure

US5422513A · kind A · utility

118Cited by
11References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 4, 1993
Grant dateJun 6, 1995
Priority date
Expiry dateOct 4, 2013

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/3011
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A high density interconnect (HDI) structure having a dielectric multi-layer interconnect structure on a substrate is fabricated by forming a chip well, placing a chip in the well, and connecting the chip to the interconnect structure. Additionally, temperature sensitive chips or devices may be located beneath the dielectric multi-layer interconnect structure. A spacer die may be located in the substrate while the interconnect structure is fabricated and removed after a chip well aligned with the spacer die is formed, in order to accommodate a chip thickness which is greater than the dielectric multi-layer interconnect structure thickness.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.