Patent · US Expired

Method for measuring capacitive loads

US5430383A · kind A · utility

5Cited by
9References
6Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMar 3, 1994
Grant dateJul 4, 1995
Priority date
Expiry dateMar 3, 2014

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/31905
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An automated method of verifying the capacitance loads on signal pins of an integrated circuit test load board employs a tester operating with transmission line techniques. The tester signal first is disconnected from the load board; and the rise time of the reflected waveform is measured between the ten percent and ninety percent values. The tester signal then is connected to the load board; and once again, the rise time of the reflected waveform is measured between the ten percent and ninety percent values. These two rise time values then are employed to calculate the total amount of edge loading capacitance on the path between the tester and the load board.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.