Apparatus and method for opens and shorts testing of a circuit board
US5432460A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jan 3, 1994 |
| Grant date | Jul 11, 1995 |
| Priority date | — |
| Expiry date | Jan 3, 2014 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2805
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for testing circuit boards uses a pair of probes to contact the various nodes on the circuit board. A single one of the pair of probes may be used to deposit a charge at a being tested net and checking for the presence of a charge at subsequent nets to determine whether a short condition exists. Moreover, the pair of probes is used to contact two nodes of a network being tested to measure the resistance within the network being tested; the measured resistance being compared to a nominal resistance, to determine whether an open condition exists. In addition, the pair of probes may be used to measure the resistance between networks in order to verify or determine whether a short condition exists between networks.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.