Inventor · Boca Raton, FL, US

Edwin Flecha

11Patents
9h-index
10Co-inventors
61Inventor score

Filing activity: Jan 3, 1994 → Jun 29, 2000

Most-cited inventions

PatentTitleAreaCited byStatus
US6169281A Apparatus and method for determining side wall profiles using a scanning probe microscope having a probe dithered in lateral directions Emerging Cross-Sectional Technologies 45 Expired
US5902928A Controlling engagement of a scanning microscope probe with a segmented piezoelectric actuator Emerging Cross-Sectional Technologies 20 Expired
US6079254A Scanning force microscope with automatic surface engagement and improved amplitude demodulation Emerging Cross-Sectional Technologies 19 Expired
US5801381A Method for protecting a probe tip using active lateral scanning control Emerging Cross-Sectional Technologies 16 Expired
US5918274A Detecting fields with a single-pass, dual-amplitude-mode scanning force microscope Emerging Cross-Sectional Technologies 15 Expired
US6318159A Scanning force microscope with automatic surface engagement Emerging Cross-Sectional Technologies 12 Expired
US6220084A Detecting fields with a single-pass, dual-amplitude-mode scanning force microscope Emerging Cross-Sectional Technologies 12 Expired
US5432460A Apparatus and method for opens and shorts testing of a circuit board Physics 11 Expired
US5773824A Method for improving measurement accuracy using active lateral scanning control of a probe Emerging Cross-Sectional Technologies 9 Expired
US6167753A Detecting fields with a single-pass, dual-amplitude-mode scanning force microscope Emerging Cross-Sectional Technologies 6 Expired
US6234009A Controlling motion of a scanning force microscope probe tip moving into engagement with a sample surface Emerging Cross-Sectional Technologies 2 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.