Patent · US Expired

Method for making collector up bipolar transistors having reducing junction capacitance and increasing current gain

US5434091A · kind A · utility

13Cited by
13References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 7, 1994
Grant dateJul 18, 1995
Priority date
Expiry dateOct 7, 2014

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S148/072

Abstract

This is a method of fabricating a bipolar transistor on a wafer. The method can comprise: forming a doped emitter contact layer 31 on a substrate 30; forming a doped emitter layer 32 on top of the emitter contact layer, the emitter layer doped same conductivity type as the emitter contact layer; forming a doped base epilayer 34 on top of the emitter layer, the base epilayer doped conductivity type opposite of the emitter layer; forming a doped collector epilayer 36, the collector epilayer doped conductivity type opposite of the base layer to form the bipolar transistor; forming an collector contact 38 on top of the collector layer; forming a base contact 40 on top of the base layer; forming a emitter contact 44 on top of the emitter contact layer; and selective etching the emitter layer to produce an undercut 45 beneath the base layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.