Patent · US Expired

Semiconductor processing

US5437765A · kind A · utility

21Cited by
5References
13Claims
0Family size

Assignee

Inventor

Key dates

Filing dateApr 29, 1994
Grant dateAug 1, 1995
Priority date
Expiry dateApr 29, 2014

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/31116
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A dry etch process for stripping LOCOS nitride masks (302) with fluorine based removal of oxynitride (312) followed by fluorine plus chlorine based removal of nitride (302) and any silicon buffer layer (303) without removal of pad oxide (304).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.