Test signal generator on substrate to test
US5442642A · kind A · utility
34Cited by
5References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 11, 1992 |
| Grant date | Aug 15, 1995 |
| Priority date | — |
| Expiry date | Dec 11, 2012 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/14
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A test system is added to a substrate and a test mode of operation is added to the timing and control functions of a system on the substrate. When a multifunctional system on the substrate is tested, a first functional subsystem is connected to an external tester. The tester causes the timing and control system to enter the test mode of operation. When in the test mode of operation, the test system provides a signal derived from a signal generator on the substrate. The generated signal is coupled to a second functional subsystem so that functional independence of the first and second subsystems can be verified.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.