Patent · US Expired

Method of making an EEPROM

US5453388A · kind A · utility

17Cited by
18References
2Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 7, 1993
Grant dateSep 26, 1995
Priority date
Expiry dateOct 7, 2013

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B69/00

Abstract

Disclosed is a flash EEPROM cell needing only a 5 volt external source using an on-chip voltage multiplier circuit to provide high voltages necessary to effect Fowler-Nordheim tunneling during both the program and erase modes. Properties of dielectric layers between a floating gate and a control gate and between the floating gate and a drain region differ to facilitate programming and erasing of the floating gate. Also disclosed is a method for producing a flash EEPROM cell by forming the insulative layer between a floating gate and a control gate to have a capacitance lower than the capacitance of the insulating layer between the floating gate and a drain region.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.