Patent · US Expired

Analog-to-digital converter

US5481129A · kind A · utility

26Cited by
6References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 21, 1995
Grant dateJan 2, 1996
Priority date
Expiry dateFeb 21, 2015

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03M1/365
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

A two-step analog-to-digital converter and BiCMOS fabrication method. The fabrication method provides pseudosubstrate isolation of digital CMOS devices from the analog devices. The converter uses NPN current switching in a flash analog-to-digital converter and in a digital-to-analog converter for low noise operation. CMOS digital error correction and BiCMOS output drivers provide high packing density plus large output load handling. Timing control aggregates switching events and puts them into intervals when noise sensitive operations are inactive. The fabrication method uses a thin epitaxial layer with limited thermal processing to provide NPN and PNP devices with large breakdown and Early voltages. Laser trimmed resistors provide small long term drift due to dopant stabilization in underlying BPSG and low hydrogen nitride passivation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.