Simultaneous capacitive open-circuit testing
US5486753A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Sep 8, 1994 |
| Grant date | Jan 23, 1996 |
| Priority date | — |
| Expiry date | Sep 8, 2014 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/312
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
To test for proper connections of integrated-circuit connection pins (22) on a circuit board (12) to the conductive paths to which they should be connected, a tester (10) applies signals of different frequencies to paths to be connected to different IC pins provided by the same integrated-circuit package (24). The resultant composite electric-field signal in the vicinity of the integrated-circuit package (24) is coupled to a capacitive probe (42), and the probe signal is subjected to frequency analysis (58-1, 58-2 , . . . 58-J) to determine whether the applied frequency components are present in the signal with sufficient magnitudes. If the magnitude in the sensed signal of an applied frequency component is not great enough, the tester generates an indication that the corresponding IC pin has not been properly connected.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.