Patent · US Expired

Method for the fabrication of electrostatic microswitches

US5489556A · kind A · utility

13Cited by
3References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 29, 1994
Grant dateFeb 6, 1996
Priority date
Expiry dateJun 29, 2014

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01H59/0009
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A method for fabricating an electrostatic microswitch has the steps of depositing a silicon nitride layer over a silicon substrate with an opening therethrough to expose the planned sacrificial layer region; oxidation to form a silicon dioxide sacrificial layer; phosphorus ion implantation into the sacrificial layer; forming a phosphorus-doped polysilicon microbeam of the microswitch and its electrode contacts; lateral etching all of the silicon dioxide sacrificial layer in buffered hydrofluoric acid to form an air gap between the microbeam and the substrate; rinsing the structure in DI water, and then in methanol; and drying the structure by a warm nitrogen flow.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.