Retention of test probes in translator fixtures
US5493230A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Aug 16, 1994 |
| Grant date | Feb 20, 1996 |
| Priority date | — |
| Expiry date | Aug 16, 2014 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2808
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A translator pin retention system for a translator fixture for a printed circuit board tester having a pattern of test probes facing away from a base plate upon which the translator fixture is mounted. The fixture comprises a plurality of essentially parallel and spaced apart translator plates having patterns of preformed holes for containing and supporting straight, solid translator pins extending through the plates of the translator fixture for use in translating test signals between test points on a printed circuit board supported by the fixture and the test probes on the base of the tester. A thin, flexible pin retention sheet of an elastomeric material rests on one of the translator plates so that the translator pins that extend through the translator plate on which the sheet rests also extend through the pin retention sheet. The pin retention sheet has a preformed pattern of flexible slotted openings undersized with respect to the size of the translator pins which extend through the pin retention sheet so that the elastomeric properties of the pin retention sheet naturally apply a compression force around the translator pins to retain the pins in the fixture. The pin retentio…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.