Devices and methods for detection of an analyte based upon light interference
US5494829A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jun 10, 1993 |
| Grant date | Feb 27, 1996 |
| Priority date | — |
| Expiry date | Jun 10, 2013 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S436/805
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Instrument configured and arranged to detect the presence or amount of an analyte of interest on the substrate of an optical device. The instrument has a source of linearly polarized, monochromatic light positioned at an angle other than Brewster's angle relative to the substrate; and an analyzer positioned at the same angle relative to the substrate at a location suitable for detecting reflected polarized light from the substrate; wherein the analyzer is configured and arranged to approximately maximize the change in intensity of the light reflected from the substrate that is transmitted through the analyzer when a change in mass occurs at the substrate relative to an unreacted surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.