Patent · US Expired

Method of making junction-isolated high voltage MOS integrated device

US5496761A · kind A · utility

7Cited by
4References
2Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 2, 1995
Grant dateMar 5, 1996
Priority date
Expiry dateJun 2, 2015

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D84/151

Abstract

An integrated device includes isolating regions of a first type of conductivity, each surrounding an epitaxial pocket of an opposite type of conductivity, and housing drain and source regions, and covered with an oxide layer housing gate regions and over which extend the source, drain and gate connections. For linearizing potential distribution at the epitaxial pocket--isolating region junction and close to the source regions beneath the connections, these regions are provided with a double chain of condensers embedded in the oxide layer and the terminal elements and the intermediate element of which are biased to predetermined potentials.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.