Patent · US Expired

Semiconductor stack structures and fabrication/sparing methods utilizing programmable spare circuit

US5502333A · kind A · utility

263Cited by
10References
25Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 30, 1994
Grant dateMar 26, 1996
Priority date
Expiry dateMar 30, 2014

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/19107
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Electronic semiconductor structures utilize an electrically programmable spare circuit incorporated with a multichip package. The programmable sparing capability in the multichip package is accomplished either with or without the inclusion of a spare chip(s). With a spare memory circuit, individual failed memory cells in the semiconductor chips of a stack can be functionally replaced by memory cells of the spare memory circuit subsequent to encapsulation and burn-in testing. With use of a spare chip, non-volatile sparing can occur subsequent to encapsulation and burn-in testing without physical rewiring of a wire bond connection. Specific details of alternate electronic semiconductor structures, and fabrication and sparing methods therefore, are set forth.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.