Patent · US Expired

Method of and apparatus for removing an organic film

US5503708A · kind A · utility

47Cited by
2References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 23, 1993
Grant dateApr 2, 1996
Priority date
Expiry dateNov 23, 2013

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/31138
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

An organic film removing method uses an organic film removing apparatus comprising a processing vessel defining a processing chamber, a wafer support for supporting a semiconductor wafer within the processing chamber, and a mixed gas supplier for supplying a mixed gas consisting of an alcohol or alcohols, and ozone gas or an ozone-containing gas into the processing chamber so that the mixed gas acts on an organic film pattern on the surface of the supported semiconductor wafer. The apparatus continuously supplies the mixed gas into the processing chamber at least in a period between a time immediately before mounting the semiconductor wafer on the wafer support and a time when the organic film is removed completely; conveys the semiconductor wafer into the processing chamber; supports the semiconductor wafer within the processing chamber; and heats the patterned organic film on the surface of the supported semiconductor wafer at a temperature in a range below a temperature at which substantial defects will be formed in the elements of a semiconductor device to be formed on the semiconductor wafer. This method is capable of ashing the organic film at an ashing rate equal to or highe…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.