Patent · US Expired

SOI DRAM with field-shield isolation and body contact

US5508219A · kind A · utility

96Cited by
2References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 5, 1995
Grant dateApr 16, 1996
Priority date
Expiry dateJun 5, 2015

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D86/201

Abstract

An SOI deep-trench DRAM having body contacts and field shield isolation makes contact between the SOI device layer and the field shield layer at selected sites between adjacent deep trench capacitors. The field shield layer is biased negative to provide better isolation and to set the body potential of the array transistors.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.