Patent · US Expired

Method of diffusing a metal through a silver electrode to form a protective film on the surface of the electrode

US5529954A · kind A · utility

40Cited by
9References
5Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 7, 1995
Grant dateJun 25, 1996
Priority date
Expiry dateJun 7, 2015

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/922
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A semiconductor device includes a first metal film formed on a semiconductor substrate, a second metal film formed on the first metal film and containing silver as a main component, and a protective film containing a metal element of the first metal film and covering at least the upper surface of the second metal film. The protective film is formed by annealing in an atmosphere containing a predetermined element. That is, the metal element of the first metal film is diffused into the second metal film and reacts with the predetermined element in the atmosphere on the surface of the second metal film, thereby forming the protective film. Aggregation of silver is prevented in the presence of the protective film.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.