Yukihiro Ushiku
46Patents
14h-index
67Co-inventors
84Inventor score
Filing activity: Apr 7, 1983 → Jul 10, 2009
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5844278A | Semiconductor device having a projecting element region | Electricity | 116 | Expired |
| US5763953A | Semiconductor device and method of manufacturing the same | Emerging Cross-Sectional Technologies | 64 | Expired |
| US5032890A | Semiconductor integrated circuit with dummy patterns | Electricity | 46 | Expired |
| US5529954A | Method of diffusing a metal through a silver electrode to form a protective film on the surface of the electrode | Emerging Cross-Sectional Technologies | 40 | Expired |
| US5434440A | Semiconductor device and method of manufacturing the same | Emerging Cross-Sectional Technologies | 27 | Expired |
| US5675176A | Semiconductor device and a method for manufacturing the same | Electricity | 26 | Expired |
| US6184083A | Semiconductor device and method of manufacturing the same | Emerging Cross-Sectional Technologies | 21 | Expired |
| US4661721A | Clock driver distribution system in a semiconductor integrated circuit device | Physics | 21 | Expired |
| US5898203A | Semiconductor device having solid phase diffusion sources | Emerging Cross-Sectional Technologies | 18 | Expired |
| US7057259B2 | Semiconductor wafer with ID mark, equipment for and method of manufacturing semiconductor device from them | Emerging Cross-Sectional Technologies | 18 | Expired |
| US5028552A | Method of manufacturing insulated-gate type field effect transistor | Emerging Cross-Sectional Technologies | 18 | Expired |
| US6885950B2 | Method, apparatus, and computer program of searching for clustering faults in semiconductor device manufacturing | Electricity | 17 | Expired |
| US5185279A | Method of manufacturing insulated-gate type field effect transistor | Emerging Cross-Sectional Technologies | 14 | Expired |
| US5698881A | MOSFET with solid phase diffusion source | Electricity | 14 | Expired |
| US5903027A | MOSFET with solid phase diffusion source | Electricity | 14 | Expired |
| US7702413B2 | Semiconductor device manufacturing system and method for manufacturing semiconductor devices including calculating oxide film thickness using real time simulator | Emerging Cross-Sectional Technologies | 13 | Active |
| US7221991B2 | System and method for monitoring manufacturing apparatuses | Emerging Cross-Sectional Technologies | 13 | Expired |
| US4587549A | Multilayer interconnection structure for semiconductor device | Electricity | 12 | Expired |
| US6885972B2 | Method for predicting life span of rotary machine used in manufacturing apparatus and life predicting system | Emerging Cross-Sectional Technologies | 12 | Expired |
| US5739575A | Dielectrically isolated substrate and method for manufacturing the same | Electricity | 11 | Expired |
| US6937963B2 | Method for avoiding irregular shutoff of production equipment and system for avoiding irregular shutoff | Physics | 11 | Expired |
| US6909993B2 | Method for diagnosing failure of a manufacturing apparatus and a failure diagnosis system | Emerging Cross-Sectional Technologies | 11 | Expired |
| US6865513B2 | Method for predicting life of rotary machine and determining repair timing of rotary machine | Physics | 11 | Expired |
| US7324855B2 | Process-state management system, management server and control server adapted for the system, method for managing process-states, method for manufacturing a product, and computer program product for the management server | Emerging Cross-Sectional Technologies | 10 | Expired |
| US6944572B2 | Apparatus for predicting life of rotary machine and equipment using the same | Physics | 9 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.