Patent · US Expired

Probe card assembly

US5530371A · kind A · utility

69Cited by
12References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 24, 1995
Grant dateJun 25, 1996
Priority date
Expiry dateApr 24, 2015

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R1/07378
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A carousel for a probe card assembly which includes opposed planar rings supported and spaced apart by flexible supports. The flexible supports, while supporting the planar rings, also allow the planar rings to rotate with respect to each other. Also included are a plurality of connecting means which pass through perforations in the planar rings so as to thereby make interconnection between a probe card and an interface card in a semiconductor test system.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.