Apparatus for a test access architecture for testing of modules within integrated circuits
US5534774A · kind A · utility
13Cited by
10References
6Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 23, 1992 |
| Grant date | Jul 9, 1996 |
| Priority date | — |
| Expiry date | Apr 23, 2012 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318544
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test access architecture is implemented which allows embedded testing of reusable modules and their interconnections with each other and with primary system inputs and outputs, utilizing reusable test vectors regardless of the configuration of the integrated circuit. Also provided is a method and apparatus for controlling and observing signals within the logic of a module, using the same test access architecture.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.