Patrick Themins
5Patents
3h-index
4Co-inventors
50Inventor score
Filing activity: Apr 23, 1992 → Mar 27, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5604432A | Test access architecture for testing of circuits modules at an intermediate node within an integrated circuit chip | Physics | 26 | Expired |
| US5534774A | Apparatus for a test access architecture for testing of modules within integrated circuits | Physics | 13 | Expired |
| US8244951B2 | Method and apparatus to facilitate system to system protocol exchange in back to back non-transparent bridges | Physics | 3 | Active |
| US9594717B2 | Method and apparatus to facilitate system to system protocol exchange in back to back non-transparent bridges | Physics | 1 | Active |
| US8996780B2 | Method and apparatus to facilitate system to system protocol exchange in back to back non-transparent bridges | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.