Patent · US Expired

On-chip ECC status

US5535226A · kind A · utility

33Cited by
15References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 31, 1994
Grant dateJul 9, 1996
Priority date
Expiry dateMay 31, 2014

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/1024
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

In one aspect, a memory device employing device-level error correction tracks the status of the error correction in terms of whether error correction is active or inactive, whether an uncorrectable error beyond the capability of the device-level correction is detected, whether a recovery option from an uncorrectable error is active and whether the recovery option has been reset. In another aspect, a diagnostic method for determining a status for one or more aspects of device-level error correction employed by a memory device is provided. In the diagnostic method, the status is determined for the one or more aspects, a flag is set based on the status, the flag is latched, a diagnostic code is input into the memory device and the latched flag is read.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.