Patent · US Expired

Method of making II-VI semiconductor infrared light detector

US5535699A · kind A · utility

5Cited by
4References
1Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 7, 1995
Grant dateJul 16, 1996
Priority date
Expiry dateApr 7, 2015

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/02557
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method for producing a photo-voltaic infrared detector including growing a crystalline CdHgTe layer on a CdTe substrate by liquid phase epitaxy using a growth melt including tellurium as a solvent to which indium is added as a dopant impurity in a concentration of from 0.01 to 0.1 ppm; annealing the CdHgTe layer to produce a p-type CdHgTe layer including indium as an n-type background dopant impurity; forming an n-type region of a desired depth as a light receiving region at the surface of the p-type CdHgTe layer by implanting a dopant impurity producing n-type conductivity and annealing; and forming an n-side electrode on the n-type region and a p-side electrode a prescribed distance from the n-type region on the p-type CdHgTe layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.