Image-to-image registration focused ion beam system
US5541411A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jul 6, 1995 |
| Grant date | Jul 30, 1996 |
| Priority date | — |
| Expiry date | Jul 6, 2015 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2237/31742
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
An image-to-image registration system employs interactive computer graphic systems to align and register a number of image representations of a particular device from a variety of sources including, for example, optical microscopic images, computer aided design representations, etc., to an image obtained by a focused ion beam system. The registration enables accurate alignment of the images to the FIB image so that subsurface features which may not be detectable via the FIB image may be located and used to guide operation of the FIB system for milling or conductor/insulator deposition or the like. Counting of aluminum grains is enhanced by use of the invention to register images of a sample taken at several different tilt angles. The registered images are combined to give a more accurate representation of grain boundaries, enabling a more accurate grain count.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.