Patent · US Expired

Method for manufacturing a semiconductor device using a catalyst

US5543352A · kind A · utility

276Cited by
3References
20Claims
0Family size

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Key dates

Filing dateNov 16, 1994
Grant dateAug 6, 1996
Priority date
Expiry dateNov 16, 2014

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02F1/13454
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method for manufacturing a thin film transistor having a crystalline silicon layer as an active layer comprises the steps of disposing a solution containing a catalyst for promoting a crystallization of silicon in contact with an amorphous silicon film, crystallizing the amorphous silicon at a relatively low temperature and then improving the crystallinity by irradiating the film with a laser light. The concentration of the catalyst in the crystallized silicon film can be controlled by controlling the concentration of the catalyst in the solution.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.