Patent · US Expired

Probe card assembly having a ceramic probe card

US5546012A · kind A · utility

64Cited by
12References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 15, 1994
Grant dateAug 13, 1996
Priority date
Expiry dateApr 15, 2014

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R1/07378
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Disclosed is a probe card assembly which includes an interface card having a plurality of contact pads on at least one surface thereof, a probe card having a plurality of contact pads on at least one surface thereof, and a carousel interposed between the interface card and the probe card having a plurality of connecting means for making contact between the interface card contact pads and probe card contact pads. Also disclosed are the probe card.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.