Patent · US Expired

Method for detecting and characterizing flaws in engineering materials

US5549002A · kind A · utility

18Cited by
6References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 1, 1994
Grant dateAug 27, 1996
Priority date
Expiry dateJul 1, 2014

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01S7/52079
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for detecting and characterizing flaws in an object having an arbitrary-shaped geometry. The present invention uses a synthetic aperture focusing technique (SAFT) which enables maximum aperture imaging. Maximum aperture imaging is attained by determining whether a plurality of reconstruction points within an object are in the width of a transmitted ultrasonic sound wave.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.