Patent · US Expired

Method and apparatus for adjusting the operating diameter of a probe in a rotating testing head

US5550468A · kind A · utility

40Cited by
6References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 23, 1994
Grant dateAug 27, 1996
Priority date
Expiry dateMar 23, 2014

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B7/30
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and apparatus for testing an elongate product for faults and defects, which comprises a rotatable testing head which permits the elongate product to be passed coaxially therethrough and which mounts a pair of testing probes so as to permit adjustment of their operating diameter. In order to automatically adjust the positions of the probes to accommodate elongate products of different sizes, there is provided an external adjustment unit, which stops the testing head in a predetermined angular position. The adjustment unit contains an external adjustment drive and when the rotation of the testing head has stopped, the external adjustment drive is advanced into operative engagement with the adjustable mounting of the testing probes. A measuring pin is also advanced into contact with the mounting of the testing probes so as to monitor the exact position of the probes, and during the repositioning of the probes a signal from the measuring pin is fed back to a control device to assure the precise positioning of the probes.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.