Patent · US Expired

Method for making a metal to metal capacitor

US5576240A · kind A · utility

52Cited by
14References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 9, 1994
Grant dateNov 19, 1996
Priority date
Expiry dateDec 9, 2014

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S148/014

Abstract

A method for making a metal-to-metal capacitor for an integrated circuit includes forming a layer of titanium/titanium nitride on a polysilicon which has been patterned with interlevel dielectrics. A capacitor dielectric is then deposited, followed by patterning with photoresist to delineate the capacitor, etching to remove extraneous dielectric, deposition of aluminum, further patterning and etching to define the capacitor and access area, and removal of photoresist.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.