Apparatus for automatic testing of complex devices
US5583430A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Apr 19, 1994 |
| Grant date | Dec 10, 1996 |
| Priority date | — |
| Expiry date | Apr 19, 2014 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2834
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus for testing an integrated circuit device (DUT) having an input port and an output port comprises multiple state devices each having multiple states that occur in a predetermined sequence and each having an output port at which it provides an event signal representative of its current state. At least a first of the state devices is an emitting device that emits an event marker signal at a predetermined time in advance of entering a predefined state, at least a second of the state devices is a receiving device that responds to receipt of an event marker signal in a predetermined manner after lapse of a predetermined time, at least one of the state devices has its output port connected to the input port of the DUT, and at least one of the state devices is a measurement device connected to the output port of the DUT. An interconnection matrix is connected to each state device and allows each state device to communicate an event marker signal to each other state device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.