Credence Systems Corporation
255Patents
19Active
255Granted
44Portfolio score
Filing activity: Apr 26, 1989 → Sep 28, 2010 · 19 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5371851A | Graphical data base editor | Physics | 167 | Expired |
| US6356224B1 | Arbitrary waveform generator having programmably configurable architecture | Physics | 164 | Expired |
| US5684421A | Compensated delay locked loop timing vernier | Electricity | 117 | Expired |
| US5883523A | Coherent switching power for an analog circuit tester | Physics | 108 | Expired |
| US6028439A | Modular integrated circuit tester with distributed synchronization and control | Physics | 72 | Expired |
| US6011403A | Circuit arrangement for measuring leakage current utilizing a differential integrating capacitor | Physics | 69 | Expired |
| US5712883A | Clock signal distribution system | Electricity | 69 | Expired |
| US6105157A | Salphasic timing calibration system for an integrated circuit tester | Physics | 67 | Expired |
| US6587979B1 | Partitionable embedded circuit test system for integrated circuit | Physics | 65 | Expired |
| US6812464B1 | Superconducting single photon detector | Physics | 65 | Expired |
| US5963074A | Programmable delay circuit having calibratable delays | Electricity | 60 | Expired |
| US6040700A | Semiconductor tester system including test head supported by wafer prober frame | Physics | 52 | Expired |
| US7135678B2 | Charged particle guide | Electricity | 51 | Expired |
| US5974579A | Efficient built-in self test for embedded memories with differing address spaces | Physics | 51 | Expired |
| US6396706B1 | Self-heating circuit board | Electricity | 48 | Expired |
| US6304989A | Built-in spare row and column replacement analysis system for embedded memories | Physics | 47 | Expired |
| US6859031B2 | Apparatus and method for dynamic diagnostic testing of integrated circuits | Physics | 44 | Expired |
| US5068601A | Dual function cam-ring system for DUT board parallel electrical inter-connection and prober/handler docking | Physics | 42 | Expired |
| US6085346A | Method and apparatus for built-in self test of integrated circuits | Physics | 42 | Expired |
| US5999044A | Differential driver having multiple output voltage ranges | Electricity | 40 | Expired |
| US6128188A | Self-balancing thermal control device for integrated circuits | Electricity | 39 | Expired |
| US5935256A | Parallel processing integrated circuit tester | Physics | 39 | Expired |
| US6057716A | Inhibitable continuously-terminated differential drive circuit for an integrated circuit tester | Physics | 36 | Expired |
| US6154715A | Integrated circuit tester with real time branching | Physics | 36 | Expired |
| US6157231A | Delay stabilization system for an integrated circuit | Electricity | 36 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.