Patent · US Expired

Method for manufacturing a semiconductor device containing a crystallization promoting material

US5585291A · kind A · utility

212Cited by
13References
30Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 29, 1994
Grant dateDec 17, 1996
Priority date
Expiry dateNov 29, 2014

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/918
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method for manufacturing a semiconductor device having a crystalline silicon semiconductor layer comprises the steps of heat crystallizing an amorphous silicon semiconductor layer at a relatively low temperature because of the use of a crystallization promoting material such as Ni, Pd, Pt, Cu, Ag, Au, In, Sn, Pb, P, As, and Sb. The crystallization promoting material is introduced by mixing it within a liquid precursor material for forming silicon oxide and coating the precursor material onto the amorphous silicon film. Thus, it is possible to add the crystallization promoting material into the amorphous silicon film at a minimum density.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.