Patent · US Expired

Means and apparatus to minimize the effects of silicon processing defects in programmable logic devices

US5592102A · kind A · utility

84Cited by
34References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 19, 1995
Grant dateJan 7, 1997
Priority date
Expiry dateOct 19, 2015

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03K19/17764
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

A programmable logic array integrated circuit has several regular columns of programmable logic circuitry and a spare column which includes a subset of the programmable logic circuitry that is included in a regular column. In the event of a defect in the circuitry in a regular column that is duplicated in the spare column, the regular column logic functions that are thus duplicated are shifted from column to column so that the spare column circuitry is put to use and the defective regular column circuitry is not used. Regular column functions that are not duplicated in the spare column are not shifted. Data for programming the columns is selectively routed to the columns with or without column shifting, depending on whether that data is for functions that are or are not duplicated in the spare column.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.