Threshold voltage measuring device for memory cells
US5600594A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Mar 31, 1995 |
| Grant date | Feb 4, 1997 |
| Priority date | — |
| Expiry date | Mar 31, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C16/04
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A circuit device for measuring the threshold voltage distribution among electrically programmable, non-volatile memory cells, which device comprises a differential amplifier having a first input connected to a first circuit leg including at least one memory cell and a second input connected to a second or reference circuit leg, and circuit means effective to cause an unbalance in the values of the currents flowing in the reference leg. The device is connected between a first supply voltage reference and a second voltage reference, and said circuit means comprise a generator of a varying current as a function of the supply voltage which is associated with the reference leg.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.