Patent · US Expired

Semiconductor device having polycrystalline silicon load devices

US5602408A · kind A · utility

19Cited by
0References
19Claims
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Assignee

Inventors

Key dates

Filing dateApr 10, 1995
Grant dateFeb 11, 1997
Priority date
Expiry dateApr 10, 2015

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B10/15

Abstract

A semiconductor device comprises a silicon semiconductor substrate and an insulating film formed on a surface of the silicon semiconductor substrate. One of a surface of the silicon semiconductor substrate or a surface of the insulating film is provided with at least one step portion. A polycrystalline silicon layer is formed uniformly on at least a side surface of the step portion and a top surface of the insulating film. The polycrystalline silicon layer which is formed on the side surface of the step portion comprises a resistance element, and a portion of the polycrystalline silicon layer which is formed on the top surface of the insulating film is doped with an impurity to form a conductive element. By this construction, the area occupied by the load devices on the semiconductor substrate is effectively reduced, thereby increasing the packing density of the semiconductor device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.