Patent · US Expired

Polishing apparatus of semiconductor wafer

US5605488A · kind A · utility

136Cited by
13References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 27, 1994
Grant dateFeb 25, 1997
Priority date
Expiry dateOct 27, 2014

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24B49/14
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

A plurality of cells are provided in a concave portion of a top plate. A cloth to which water is penetrated is provided in a back face of each cell, and a wafer is attracted by the cloth. First and second pipes are connected to each cell. The first pipe introduces liquid to the cell, and the second pipe discharges liquid from the cell, and guides liquid to the first pipe. A constant-temperature device is provided to each first pipe, and a temperature of liquid of each cell is adjusted by the constant-temperature device in accordance with a temperature distribution of the wafer. Whereby, a polishing rate of each part of the wafer can be equalized.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.