Patent · US Expired

Method of dynamic thresholding for flaw detection in ultrasonic C-scan images

US5608814A · kind A · utility

24Cited by
12References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 17, 1994
Grant dateMar 4, 1997
Priority date
Expiry dateNov 17, 2014

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06V10/28
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

The method of producing a binary flaw-no flaw image of an object, including employing an ultrasonic data acquisition system to obtain data values f(i,j) which define a C-scan image (F) of the object, dividing the C-scan image (F) into a plurality of subimages (G.sub.k for k=1,2, . . . ,K), determining regional threshold levels y(k) for each of the plurality of subimages, using said regional threshold levels y(k) to determine pixel threshold levels t(i,j) for each pixel (i,j) of the image (F) by interpolation, and generating a binary flaw-no flaw image (B) by assigning binary values thereto based on a comparison between the pixel threshold levels t(i,j) and data values f(i,j), thereby providing a method which achieves a high probability of flaw detection and a low probability of false flaw indications.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.